The AFSEM system enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market and can easily added to your system. Due to the unique design of the AFSEM™ system it will not interfere with other methods of your system (e.g. FIB, FEBID, EDX) but will add information regarding the structure of your sample.
The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with features of the atomic force microscopy system (alpha300 A) for high-resolution nanoscale surface characterization and thus facilitates a comprehensive understanding of the samples.
The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and Nearfield-Raman (Raman-SNOM) imaging can be easily performed.
For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with scanning near-field optical microscopy (SNOM) for optical imaging with resolution beyond the diffraction limit. It combines all the features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for combined high-resolution Raman imaging techniques such as nearfield-Raman imaging.