Stephane Struyve

Sales Manager

LOT-QuantumDesign


+32 2 3084324
Mobile: Mobile: +32 495 79 71 75

Products

Motorized Czerny-Turner spectrographs
High-throughput bright field and fluorescence scanner
sCMOS cameras for physical sciences
Optical coherence tomography system
High-throughput bright-field scanner
Imagerie corrélative AFM/MEB
Voltage controlled current source
Cryostats with closed helium cycles
Dichroic filters and sets
High-throughput transmission grating spectrograph
NIR spectroscopy with photo diode array
Basic Raman system
Superior confocal Raman imaging system
Chemical and nanoscale imaging system
Combined Raman and scanning nearfield optical microscopy (SNOM) system
Raman, AFM and SNOM all-in-one system
Large area profilometry for topographic Raman imaging
Automated 3D Raman imaging system
Spin coater
Thermographic NDE
Spectroradiometer 200 - 450 nm and 250 - 1050 nm
Ellipsometer for texture Si solar cells T-Solar
FAAST X-ray source
Advanced technology helium liquefier
UV polarizers 240 - 400 nm
Visible light polarizers 420 - 700 nm
Silicon infrared polarizers 3000 - 15000 nm
Infrared polarizers 700 - 2500 nm
Inorganic absorptive polarizers
Pixelated polarizers
Ultra broadband polarizers
Low-noise CCD detectors
Optics and optical coatings
Optical tables and breadboards
Carbon nanotube characterization
Cryogenic Probe Station
AC Susceptometer
Ferromagnetic resonance spectroscopy (FMR)
Manual stages and holders
Cameras and detectors for time-resolved imaging and spectroscopy
CCD cameras for direct detection (<20 keV)
Flexible quartz crystal microbalance system
Four-channel quartz crystal microbalance system
Fully automated quartz crystal microbalance system
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
Arc light sources
Hand-held light meter & optometer
Spectroradiometer
Short introduction: Ellipsometry
Halogen light sources
Deuterium light sources
IR sources
Fiber optic light sources
Light sources for calibration
Optical filters for light sources
Light source accessories
Basics
Tunable monochromatic light sources
Datalogging optometer
Hartmann-Shack wavefront sensor
Research radiometer with Wifi
Research picoammeter with Wifi
FLX Flexus thin film stress measurement systems
The FP Profiler for large samples
MSH-300 with variable slits & MSH-300F with fixed slits
Raman spectroscopy filters
Magnetic field platform
Systèmes de Photolithographie
Nanoindenter
Vacuum nanoindenter
MPMS3 SQUID magnetometer
MSH-150 with variable slits & MSH-150F with fixed slits
MSHD-300 with variable slits & MSHD-300F with fixed slits
Cryogenic temperature controllers
Cryogenic temperature monitors
Bi-convex lenses
Plano concave lenses
Bi-concave lenses
Plano convex lenses
Astronomy/UVBRI filters
Neutral density filter sets
Monochromator order sorting filters
Standard infrared bandpass filters
Heat control filters
Edge filters
Calibration filter sets
Standard bandpass filters and sets
Cryogenic accessories
Cryogenic temperature sensors
Helium recovery and liquefaction plants
Colored glass filters
Nanoindenter NanoTest CORE Range
Short introduction: nanoindentation
M-2000 Ellipsomètre spectroscopique de référence
Alpha-SE Ellipsomètre spectroscopique compact
RC2 Ellipsomètre spectroscopique à double compensateur tournant
VASE Ellipsomètre spectroscopique combinant large gamme spectrale et grande résolution spectrale
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
IR-VASE Ellipsomètre spectroscopique Infra-Rouge
Dielectric notch filters
Laser line filters
Modified magnetron ET filter sets
Standard Long Wave Pass Filters
Infrared Windows and Substrates
Custom infrared coatings
Infrared Neutral Density Filters
Broadband AR Coating on Germanium
Semi-custom bandpass filters
Hard Coat Broadband Filters
High-transmitting bandpass filters
Metallic Neutral Density Filters
Steep-Edge Longpass Filters
Absorptive Neutral Density Filters
Threaded Filter Rings
Motorized Filter Wheel
Temperature Controller
In-situ spectroscopic ellipsometer iSE
Solar simulators
CCD cameras with shutter
EMCCD cameras
Manual single grating spectrograph
Correlative Raman imaging and scanning electron microscopy (Raman-SEM)
Echelle spectrograph
Basic Confocal Raman Microscope
High-end thermography cameras
Thermal image plates
X-ray optics
AttoMap™ - µXRF analytical microscope
EMCCD detectors for spectroscopy
High-performance CCD detectors
Closed-cycle optical cryostat
Nanoscale surface characterization system
SNOM, confocal microscopy and AFM system
Digital laser power probes
Analog laser power probes
Digital power meter kit
Beam probes
CO, HF and DF laser spectrum analyzer
CO2 laser spectrum analyzer
Vibrating Sample Magnetometer (VSM) with electromagnet
Kerr magnetometer
Advanced technology helium gas purifier
Closed-cycle optical cryostat with intermediate sample chamber and integrated cold sample electronics size
Ultra stable closed-cycle optical cryostat
Closed-cycle optical cryostat with breadboard
Portable, cryogen-free material characterization platform
Physical Property Measurement System (PPMS)
Physical Property Measurements in a cryogen-free system (PPMS DynaCool)
2 and 4 mirror infrared single crystal furnace
Cameras for indirect detection (>20 keV)
Stand-alone X-ray cameras
Optical tweezers
Advanced thermography for in-service inspection
Thermographic turbine test station
Complete thermographic inspection solution

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Contact

Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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European offices
© LOT Quantum Design 2016