Stephane Struyve

Sales Manager

LOT-QuantumDesign


+32 2 3084324
Mobile: Mobile: +32 495 79 71 75

Products

Echelle spectrograph
High-throughput transmission grating spectrograph
NIR spectroscopy with photo diode array
Manual single grating spectrograph
Basic Confocal Raman Microscope
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
Cameras and detectors for time-resolved imaging and spectroscopy
CCD cameras for direct detection (<20 keV)
Correlative Raman imaging and scanning electron microscopy (Raman-SEM)
Hand-held light meter & optometer
Spectroradiometer
High-end thermography cameras
Arc light sources
Nanoindenter
Vacuum nanoindenter
M-2000 Ellipsomètre spectroscopique de référence
Imagerie corrélative AFM/MEB
Motorized Czerny-Turner spectrographs
Research radiometer with Wifi
Research picoammeter with Wifi
In-situ spectroscopic ellipsometer iSE
Halogen light sources
Deuterium light sources
Basics
IR sources
Fiber optic light sources
Datalogging optometer
Light sources for calibration
Spectroradiometer 200 - 450 nm and 250 - 1050 nm
Optical filters for light sources
Tunable monochromatic light sources
Light source accessories
EMCCD cameras
UV polarizers 240 - 400 nm
X-ray optics
AttoMap™ - µXRF analytical microscope
Thermal image plates
FLX Flexus thin film stress measurement systems
sCMOS cameras
EMCCD detectors for spectroscopy
High-throughput bright-field scanner
CCD cameras with shutter
Solar simulators
High-throughput bright field and fluorescence scanner
Systèmes de Photolithographie
Optical coherence tomography system
Low-noise CCD detectors
RC2 Ellipsomètre spectroscopique à double compensateur tournant
IR-VASE Ellipsomètre spectroscopique Infra-Rouge
Closed-cycle optical cryostat
Nanoscale surface characterization system
Basic Raman system
Superior confocal Raman imaging system
Chemical and nanoscale imaging system
Combined Raman and scanning nearfield optical microscopy (SNOM) system
Raman, AFM and SNOM all-in-one system
SNOM, confocal microscopy and AFM system
Large area profilometry for topographic Raman imaging
Flexible quartz crystal microbalance system
Automated 3D Raman imaging system
Four-channel quartz crystal microbalance system
Fully automated quartz crystal microbalance system
Spin coater
Digital laser power probes
Analog laser power probes
Digital power meter kit
Alpha-SE Ellipsomètre spectroscopique compact
VASE Ellipsomètre spectroscopique combinant large gamme spectrale et grande résolution spectrale
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
Beam probes
CO, HF and DF laser spectrum analyzer
CO2 laser spectrum analyzer
Vibrating Sample Magnetometer (VSM) with electromagnet
Ellipsometer for texture Si solar cells T-Solar
AC Susceptometer
Short introduction: Ellipsometry
MPMS3 SQUID magnetometer
Kerr magnetometer
Advanced technology helium gas purifier
Cryogenic temperature monitors
Advanced technology helium liquefier
Cryogenic accessories
Cryogenic temperature sensors
Closed-cycle optical cryostat with intermediate sample chamber and integrated cold sample electronics size
Ultra stable closed-cycle optical cryostat
Helium recovery and liquefaction plants
Closed-cycle optical cryostat with breadboard
Ferromagnetic resonance spectroscopy (FMR)
Portable, cryogen-free material characterization platform
Physical Property Measurement System (PPMS)
Physical Property Measurements in a cryogen-free system (PPMS DynaCool)
Cryogenic temperature controllers
Nanoindenter NanoTest CORE Range
High-performance CCD detectors
MSH-300 with variable slits & MSH-300F with fixed slits
MSH-150 with variable slits & MSH-150F with fixed slits
MSHD-300 with variable slits & MSHD-300F with fixed slits
The FP Profiler for large samples
2 and 4 mirror infrared single crystal furnace
Short introduction: nanoindentation
FAAST™ x-ray source
LV-Series - For low-voltage TEM applications
FC-Series - Fibre-coupled CCD cameras
Application: In-situ TEM
Neutral density filter sets
Cameras for indirect detection (>20 keV)
Monochromator order sorting filters
Heat control filters
Standard Long Wave Pass Filters
Infrared Windows and Substrates
Custom infrared coatings
Infrared Neutral Density Filters
Broadband AR Coating on Germanium
Semi-custom bandpass filters
Hard Coat Broadband Filters
High-transmitting bandpass filters
Metallic Neutral Density Filters
Steep-Edge Longpass Filters
Absorptive Neutral Density Filters
Threaded Filter Rings
Motorized Filter Wheel
Temperature Controller
Astronomy/UVBRI filters
Bi-convex lenses
Bi-concave lenses
Raman spectroscopy filters
Standard infrared bandpass filters
Edge filters
Dichroic filters and sets
Calibration filter sets
IV measurement station
Plano concave lenses
Plano convex lenses
Colored glass filters
Standard bandpass filters and sets
Cryogenic Probe Station
Hartmann-Shack wavefront sensor
DE-Series - Direct detection cameras
Application: Material science
Stand-alone X-ray cameras
Laser line filters
Application: Biological Cryo-EM
Silicon infrared polarizers 3000 - 15000 nm
Optical tweezers
Dielectric notch filters
Thermographic NDE
Advanced thermography for in-service inspection
Carbon nanotube characterization
Thermographic turbine test station
Visible light polarizers 420 - 700 nm
Infrared polarizers 700 - 2500 nm
Inorganic absorptive polarizers
Pixelated polarizers
Ultra broadband polarizers
Adiabatic Demagnetisation Refrigerators (ADR) and Dilution Refrigerators (DR)
Complete thermographic inspection solution
Modified magnetron ET filter sets

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Contact

Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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European offices
© LOT Quantum Design 2016